X-Ray Instruments
FISCHERSCOPE® X-RAY XULM®/XUL®
Entry-level model with focus on time saving.
Flexible measuring devices for coating thickness measurement of filigree parts like plugs, contacts, wires or smaller circuit boards as well as for the determination of the metal content of electroplating baths and the composition of simple alloy layers.
X-ray fluorescence analysis for beginners.
The FISCHERSCOPE® X-RAY XULM®/XUL® instruments are compact, versatile XRF measuring devices ideal for non-destructive coating thickness measurement and material analysis. With the integrated proportional counter tube detector they allow fast measurements especially with large measuring distances and complex shaped samples, even with small measuring spots. These and numerous other functions make these devices indispensable tools in the areas of quality assurance, incoming goods inspection and production monitoring, especially in electroplating.
Features
- Microfocus X-ray tube
- Individual measurements
- Fix or 3-fold changeable filters
- Measuring spot approx.: Ø 0.1 mm
- Proportional counter tube detector for short measuring times
- Live image of the measuring point
- Up to 170 mm possible height of samples
- Fix or 4-fold changeable apertures
- Type approved full protection device
Applications
- Electroplating such as zinc on iron or zinc-nickel on iron as corrosion protection of mass-produced parts (nuts and bolts)
- Determination of the metal content of electroplating baths
- Decorative coatings Cr/Ni/Cu/ABS
- Coatings of connectors and contacts in the electronics industry
- Manual measuring of PCBs
- Measuring in the watch and jewelry industry
FISCHERSCOPE® X-RAY XAN®
The system for a wide range of applications.
Universal instrument for metal and precious metal analysis as well as coating thickness measurement on simple shaped samples and RoHS screening.
The right XRF device for every application.
Whether PIN detector, silicon drift detector, fixed sample support or manually operated XY-table: The FISCHERSCOPE® X-RAY XAN® offers versatile applications and is adapted to your needs. This enables precise material analysis of precious metal and gold alloys, coating thickness measurement or trace analysis. The instrument version with the 50 mm² silicon drift detector is also suitable for RoHS measuring.
Features
- Microfocus tube with tungsten anode
- Silicon PIN and silicon drift detectors provide very good detection accuracy and high resolution
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Larger hood: From 90 up to 170 mm possible height of samples, depending on device
- Apertures: fixed or 4-fold changeable* Primary filters: fixed or 6-fold changeable*
*depending on device - Type approved full protection device
- Smallest measuring spot approx.: Ø 0.3 mm
- Determination of metal content in electroplating baths with corresponding accessories
Applications
- Non-destructive analysis of dental alloys
- Multilayer coatings
- Analysis of functional layers from 10 nm in the electronics and semiconductor industry
- Trace analyses for consumer protection, such as lead content in toys
- Metal alloy determination with highest accuracy requirements in the jewelry industry and refineries
GOLDSCOPE SD®
Analysis, value determination and authenticity testing.
Compact and robust XRF benchtop instrument for fast, cost-effective and non-destructive analysis of jewelry, coins and precious metals.
Cost-effective X-ray fluorescence analysis around gold and precious metals.
Not everything that glitters is gold: With the help of the GOLDSCOPE SD® you can check the authenticity of jewelry and analyze the composition of gold and precious metals quickly and non-destructively. The GOLDSCOPE SD® family includes various devices to cover specific requirements from the quick purchase and sale of gold to the high-precision analysis of precious metals. Different detectors as well as various space-saving housing types allow the use suiting your measuring task and location.
Features
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Silicon PIN and silicon drift detectors provide very good detection accuracy and high resolution
- Larger hood: From 90 up to 130 mm possible height of samples, depending on device
- Apertures: fixed or 4-fold changeable* Primary filters: fixed or 6-fold changeable*
*depending on device - Measuring spot approx.: Ø 0.3 mm or Ø 0.7 mm, depending on device
- Type approved full protection device
Applications
- Composition of precious metal alloys
- Authenticity check of gold jewelry, watches and coins
- Analysis of dental alloys
- Rhodium layer on gold alloy and gold layer on silver alloy
GOLDSCOPE SD® 600
Analysis, value determination and authenticity testing.
Robust XRF benchtop device optimized for the most powerful, fast and non-destructive analysis of jewelry, coins and precious metals, also suitable for larger parts.
X-ray fluorescence analysis around gold and precious metals.
The GOLDSCOPE SD® 600 is Fischer's most powerful XRF analyzer for gold and jewelry testing and precious metals analysis. With top down measurements, the sample is simply placed on the manually operated scissor table. A laser pointer serves as a positioning aid. Thus, even samples with complex geometry are no challenge for the analysis.
Features
- Microfocus tube with tungsten anode
- Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
- Peltier cooling
- Measuring spot approx.: Ø 0.25 mm
- 4-fold changeable apertures and 3-fold changeable filters
- Up to 140 mm possible height of samples
- Higher count rates and significantly reduced measuring times thanks to DPP+
Applications
- Composition of precious metal alloys
- Authenticity check of gold jewelry, watches and coins
- Analysis of dental alloys
- Rhodium layer on gold alloy and gold layer on silver alloy
FISCHERSCOPE® X-RAY XDAL® 600
Determination of thin films, trace elements and alloys.
Universal instrument for measuring on smallest structures, very thin multilayer coatings, functional coatings and very thin coatings ≤ 0.1 µm.
Universal X-ray fluorescence analysis for very thin layers.
The FISCHERSCOPE® X-RAY XDAL® 600 is the universal XRF analyzer from Fischer for the determination of thin layers, trace elements and alloys. With top down measurement, the sample is simply placed on the manually operated shear table. A laser pointer serves as a positioning aid. This means that even samples with complex geometries can be analyzed precisely and easily.
Features
- Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
- 4-fold changeable apertures and 3-fold changeable filters
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Microfocus tube with tungsten anode
- Up to 140 mm possible height of samples
- Measuring spot approx.: Ø 0.15 mm
Applications
- Analysis of thin and very thin coatings of ≤ 0.1 µm
- Measuring functional coatings in the electronics and semiconductor industry, such as on lead frames, plug contacts or PCBs
- Determination of complex multilayer systems
- Determination of lead content in solders
- Determination of phosphorus content in NiP coatings
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring.
Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
XRF automation for beginners.
The instruments of the FISCHERSCOPE® X-RAY XDL® series are predestined for measurements in quality assurance, incoming inspection and production monitoring. They are closely related to the XULM® series, with one significant difference: the measuring direction from top down! This means convenient analysis of uneven samples for you as well as the possibility of automated measuring.
Features
- Standard X-ray tube
- Apertures: fixed
Primary filters: fixed - Up to 140 mm possible height of samples
- Smallest measuring spot approx.: Ø 0.2 mm
- Determination of the metal content in electroplating baths with corresponding accessories
- Type approved full protection device
- Proportional counter tube detector for short measuring times
Applications
- Electroplated coatings such as zinc on iron as corrosion protection
- Serial testing of mass-produced parts
- Decorative chromium coatings, e. g. Cr/Ni/Cu/ABS
- All typical chromium coatings, such as Cr(VI) and new ones like Cr(III)
- Measuring of functional gold coatings on PCBs such as Au/Ni/Cu/PCB
- Coatings of connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
- Determination of the metal content of electroplating baths
FISCHERSCOPE® X-RAY XDLM®
Your entry into automated measuring.
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
XRF automation for beginners.
Equipped with a microfocus tube, multiple aperture and primary filter changer, the XDLM® series is the best choice to inspect many small parts one after the other. The instruments are closely related to the XULM® series, with only one significant difference: measuring direction from top down! This means: convenient analysis of uneven samples as well as the possibility of automated measuring and therefore predestined for quality assurance, incoming goods inspection and production monitoring. As a special solution for PCBs, the device is available as XDLM® PCB.
Features
- Microfocus tube
- Proportional counter tube detector for short measuring times and small measuring spots
- 4-fold changeable apertures
- Smallest measuring spot approx.: Ø 0.1 mm
- 3-fold changeable filters
- Various measuring table options
Applications
- Electroplated coatings such as zinc on iron as corrosion protection
- Serial testing of mass-produced parts
- Compositional analysis of special steels, such as molybdenum detection in A4
- Decorative chromium coatings, e.g. Cr/Ni/Cu/ABS
- All typical chromium coatings - also new ones such as CrVI
- Measuring of functional gold coatings on PCBs such as Au/Ni/Cu/PCB or Sn/Cu/PCB
- Coatings of connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
- Determination of the metal content of electroplating baths
FISCHERSCOPE® X-RAY XDAL®
The best detectors for thin layers.
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
X-ray fluorescence analysis for higher demands.
Thin, thinner, XDAL®: Thanks to the microfocus tube and various semiconductor detectors, the FISCHERSCOPE® X-RAY XDAL® series is ideal for applications in the field of thin and very thin coatings < 0.05 μm as well as for material analysis in the ppm range. The instrument version with the 50 mm² silicon drift detector is furthermore suitable for RoHS measuring. The flexible and, thanks to various configuration options (table, aperture, filter and detector), universal XDAL® measures reliably, precisely and stands for 100 % safety.
Features
- Microfocus tube with tungsten anode
- Measuring spot approx.: Ø 0.15 mm
- Silicon PIN and silicon drift detector for very good detection accuracy and high resolution
- 3-fold changeable filters
- Type approved full protection device
- Determination of metal content in electroplating baths with corresponding accessories
- 4-fold changeable apertures
- Up to 140 mm possible heights of samples
- Various measuring table options
Applications
- Analysis of thin and very thin coatings of ≤ 0.05 μm
- Measuring functional coatings in the electronics and semiconductor industry, such as on lead frames, plug contacts or PCBs
- Determination of complex multilayer systems
- Automated measurements, such as in quality control
- Determination of lead content in solders
- With version SDD (20 mm² or 50 mm²):
- Determination of phosphorus content in NiP layers
- Meets ENIG/ENEPIG requirements
FISCHERSCOPE® X-RAY XDV®-SDD
The high-end all-rounder.
Powerful measuring device for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
X-ray fluorescence analysis for universally highest demands.
The FISCHERSCOPE® X-RAY XDV®-SDD is one of the most powerful X-ray fluorescence instruments in the Fischer portfolio. Take your measurement performance to a new level with this premium model: In combination with the in-house developed digital pulse processor DPP+, even higher count rates can now be processed, resulting in reduced measuring times or improved repeatability of your measurement results.
Features
- Microfocus tube with tungsten anode
- Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
- Determination of metal content in electroplating baths with corresponding accessories
- Measuring spot approx.: Ø 0.25 mm
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Type approved full protection device
- Up to 140 mm possible height of samples
- 4-fold changeable apertures and 6-fold changeable filters
Applications
- Measuring functional coatings in the electronics and semiconductor industry, e.g. determining the thickness of gold coatings down to 2 nm
- Analysis of thin and very thin coatings in the electronics and semiconductor industry, such as gold/palladium layers of ≤ 0.1 μm
- Determination of complex multilayer systems
- Coating thickness measurement for photovoltaics, fuel cell and battery cell applications
- Trace analyses of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer products
- Analysis and authenticity check of gold and other precious metals and precious metal alloys
- Direct determination of phosphorus content in functional NiP layers
- Determination of the metal content of electroplating baths
FISCHERSCOPE® X-RAY XAN® 500
The specialist for field use.
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
More versatile than any other.
The FISCHERSCOPE® X-RAY XAN® 500 is the most precise mobile XRF instrument on the market. The 3-point support ensures repeatable measurement results. It ensures that the instrument is always placed correctly and kept stable during measuring. The high-quality silicon drift detector (SDD) guarantees the necessary precision for analyzing multilayer coatings and alloy coatings such as zinc-nickel. The special feature of the compact measuring device: It detects the thickness and composition of the layer in parallel in just one measurement.
Features
- Silicon drift detector for highest precision on thin films
- Three-point support and geometry enable safe placement on the sample
- Measuring spot approx.: Ø 3 mm
- Portable measuring box turns system into XRF tabletop unit
- IP54 protection class for outdoor use
- Determination of metal content in electroplating baths with corresponding accessories
- Up to 6 h operating time with one battery charge
- Weight: 1.9 kg
Applications
- Simultaneous determination of coating thickness and composition with only one measurement (such as ZnNi on Fe)
- Standard-free measuring of unknown alloys
- Measuring of large coated parts, such as machine components and housings
- Testing of electroplated layers
- Analysis of metal content of electroplating baths
- Analysis of bulky objects and small parts using the measuring box
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