JEM-2100PlusTransmission Electron Microscope
The new JEM-2100Plus TEM is a multi-purpose Transmission Electron Microscope, combining the proven optic system of the original JEM-2100 with an advanced control system for enhanced ease of operation.
Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.
The advanced control system allows integration of STEM, EDS, and EELS as well as remote operation.
The JEM-2100Plus features a high-stability goniometer stage specifically tuned for high tilt tomographic applications. An x/y piezo stage is an available option.
The JEM-2100Plus has three independent condenser lenses and produces the highest probe current for any given probe size, which allows for improved analytical and diffraction capabilities. The patented JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination. The standard incorporation of the objective mini lens means that Lorentz microscopy is a standard feature of this microscope. A high contrast aperture is available for any choice of polepiece, allowing high contrast imaging and simultaneous EDS.
The JEM-2100Plus offers a number of pumping options including full dry-pumped/turbo-pumped versions for lab environments that do not allow for oil-based or rotary pumps.
The JEM-F200 "F2" is the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical 200kV TEM. The F2 is a multi-purpose workhorse system with advanced features not found in any other non-aberration corrected S/TEM.
The boost in probe current from the Cold FEG combined with dual EDS detectors makes the F2 a top performance analytical S/TEM. The high brightness/narrow energy spread of the next-generation JEOL Cold-FEG achieves high energy resolution electron energy loss spectroscopy (EELS) for rapid identification of chemical bonding states. Dual Silicon Drift Detectors (SDD) offer the ultimate high sensitivity and throughput for X-ray analysis. Additionally, the new Advanced Scan System employs De-Scan to achieve wide-field STEM-EELs spectrum imaging.
The F2 features a quad lens condenser system that independently controls electron beam intensity (spot size) and convergence angle.
With more versatility and functionality than ever before in a non-aberration corrected S/TEM, the F2 operation is easier as well. More than 100 beam conditions can be selected at the push of a button, and prior settings can be easily recalled. ECO mode saves power consumption.
A new automated sample holder transfer system, the SpecPorter, makes it easier than ever before to load samples. Once loaded, the PicoStage conducts precise, high speed sample movements of 0.5 nm steps, allowing the operator to move the field of view smoothly over a wide spatial scale range from millimeters to picometers.
- Quad lens condenser system
- Advanced scan system
- Pico stage drive for ultra-fast, high-precision movement of field-of-view
- SpecPorter automated sample holder transfer system
- Cold FEG with narrow energy spread
- Dual Silicon Drift Detectors
- Intuitive and efficient operation