Ilion II System

Ideal for low energy surface preparation for your SEM cross section viewing.

Advantages: 

  • Vacuum load-lock and liquid nitrogen cold stage to provide rapid workflows on beam sensitive samples

  • Real-time observation of the polishing process including an optical microscope with digital imaging; images can be stored and analyzed with DigitalMicrograph® software from Gatan

  • Repeatable results from recipes and operation of the Ilion™ II via a 10" color touch screen interface

  • Damage-free surfaces for analytical techniques, such as cathodoluminescence and EBSD, where the signal is generated near the surface